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  Low-dose strain mapping by dark-field inline electron holography

Özdöl, V. B., Koch, C. T., & van Aken, P. A. (2011). Low-dose strain mapping by dark-field inline electron holography. Microscopy and Microanalysis, 17, Suppl. 2, 1228-1229.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4F10-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4F11-9
Genre: Conference Paper
Alternative Title : Microsc.Microanal.

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 Creators:
Özdöl, V. B.1, Author           
Koch, C. T.1, 2, Author           
van Aken, P. A.1, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 609590
DOI: 10.1017/S143192761100701X
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Title: Microscopy and Microanalysis 2011
Place of Event: Nashville, Tennessee
Start-/End Date: 2011-08-07 - 2011-08-11

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Title: Microscopy and Microanalysis
  Alternative Title : Microsc.Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 17, Suppl. 2 Sequence Number: - Start / End Page: 1228 - 1229 Identifier: -