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  Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy

Srot, V., Watanabe, M., Scheu, C., van Aken, P. A., Salzberger, U., Luerßen, B., et al. (2010). Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy. Solid State Ionics, 181(35-36), 1616-1622. doi:10.1016/j.ssi.2010.08.026.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4FCB-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4FCC-5
Genre: Journal Article

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 Creators:
Srot, V.1, Author           
Watanabe, M., Author           
Scheu, C., Author           
van Aken, P. A.1, Author           
Salzberger, U.1, Author           
Luerßen, B.2, Author
Janek, J.2, Author
Rühle, M.3, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Department of Materials Science & Engineering, Lehigh University, 5 E. Packer Ave., Bethlehem, PA18015, USA;Department of Chemistry, Ludwig-Maximilians-University of Munich, Butenandtstr. 5-13 (E), 81377 Munich, Germany;Institute of Physical Chemistry, Justus-Liebig-University Gießen, Heinrich-Buff-Ring 58, 35392 Gießen, Germany., ou_persistent22              
3Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497645              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM); Abt. Dosch/Rühle;
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Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 548066
DOI: 10.1016/j.ssi.2010.08.026
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Title: Solid State Ionics
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 181 (35-36) Sequence Number: - Start / End Page: 1616 - 1622 Identifier: -