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  Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy

Gigler, A. M., Huber, A. J., Bauer, M., Ziegler, A., Hillenbrand, R., & Stark, R. W. (2009). Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy. Optics Express, 17(25), 22351-22357.

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Genre: Journal Article
Alternative Title : Opt. Express

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 Creators:
Gigler, A. M., Author
Huber, A. J.1, Author              
Bauer, M.2, Author              
Ziegler, A.1, Author              
Hillenbrand, R.1, Author              
Stark, R. W., Author
Affiliations:
1Baumeister, Wolfgang / Molecular Structural Biology, Max Planck Institute of Biochemistry, Max Planck Society, ou_1565142              
2External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2009-12-07
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 442248
ISI: 000272761300009
 Degree: -

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Title: Optics Express
  Alternative Title : Opt. Express
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 17 (25) Sequence Number: - Start / End Page: 22351 - 22357 Identifier: ISSN: 1094-4087