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  Nanoscale Conductivity Contrast by Scattering-Type Near-Field Optical Microscopy in the Visible, Infrared and THz Domains

Keilmann, F., Huber, A. J., & Hillenbrand, R. (2009). Nanoscale Conductivity Contrast by Scattering-Type Near-Field Optical Microscopy in the Visible, Infrared and THz Domains. Journal of Infrared Millimeter and Terahertz Waves, 30(12), 1255-1268.

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Genre: Journal Article
Alternative Title : J. Infrared Millim. Terahertz Waves

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 Creators:
Keilmann, F.1, Author              
Huber, A. J.1, Author              
Hillenbrand, R.1, Author              
Affiliations:
1Baumeister, Wolfgang / Molecular Structural Biology, Max Planck Institute of Biochemistry, Max Planck Society, ou_1565142              

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Free keywords: Metallic conduction; Semiconductors; Correlated conductors; Conductivity contrast; Near-field optical microscopy; Visible near-field microscopy; Infrared near-field microscopy; THz near-field microscopy
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Language(s): eng - English
 Dates: 2009-12
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 437313
ISI: 000269913200003
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Title: Journal of Infrared Millimeter and Terahertz Waves
  Alternative Title : J. Infrared Millim. Terahertz Waves
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 30 (12) Sequence Number: - Start / End Page: 1255 - 1268 Identifier: ISSN: 1866-6892