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  Nyquist noise of cell adhesion detected in a neuron-silicon transistor

Voelker, M., & Fromherz, P. (2006). Nyquist noise of cell adhesion detected in a neuron-silicon transistor. Physical Review Letters, 96(22): 228102.

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Genre: Journal Article
Alternative Title : Phys. Rev. Lett.

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 Creators:
Voelker, M.1, Author              
Fromherz, P.1, Author              
Affiliations:
1Fromherz, Peter / Membrane and Neurophysics, Max Planck Institute of Biochemistry, Max Planck Society, ou_1565146              

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Language(s): eng - English
 Dates: 2006-06-09
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 287991
ISI: 000238161400059
 Degree: -

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Title: Physical Review Letters
  Alternative Title : Phys. Rev. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 96 (22) Sequence Number: 228102 Start / End Page: - Identifier: ISSN: 0031-9007