Nyquist noise of cell adhesion detected in a neuron-silicon transistor

Voelker, M.; Fromherz, P.

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Nyquist noise of cell adhesion detected in a neuron-silicon transistor

Voelker, M., & Fromherz, P. (2006). Nyquist noise of cell adhesion detected in a neuron-silicon transistor. Physical Review Letters, 96(22): 228102.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-62C3-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-62C4-1

Genre: Journal Article

Alternative Title : Phys. Rev. Lett.

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Creators:
Voelker, M.¹, Author
Fromherz, P.¹, Author

Affiliations:
1Fromherz, Peter / Membrane and Neurophysics, Max Planck Institute of Biochemistry, Max Planck Society, ou_1565146

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Language(s): eng - English

Dates: Published Online: 2006-06-09

Publication Status: Published online

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Rev. Type: Peer

Identifiers: eDoc: 287991
ISI: 000238161400059

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Title: Physical Review Letters

Alternative Title : Phys. Rev. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 96 (22) Sequence Number: 228102 Start / End Page: - Identifier: ISSN: 0031-9007