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  Infrared conductivity mapping for nanoelectronics

Knoll, B., & Keilmann, F. (2000). Infrared conductivity mapping for nanoelectronics. Applied Physics Letters, 77(24), 3980-3982.

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Knoll, B., Author
Keilmann, F.1, Author           
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1External Organizations, ou_persistent22              

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Free keywords: Microscopy; Resolution.; Applied Physics/Condensed Matter/Materials Science in Current Contents(R)/Physical, Chemical & Earth Sciences.; SNOM-XSAMP; S-SNOM
 Abstract: near and field and microscop backsearch

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 Dates: 2000
 Publication Status: Published in print
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 Identifiers: eDoc: 318618
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Title: Applied Physics Letters
Source Genre: Journal
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Pages: - Volume / Issue: 77 (24) Sequence Number: - Start / End Page: 3980 - 3982 Identifier: -