Fidelity Limits in 3-D Reconstructions - an Appraisal of Techniques for 2-D 
crystals

Saxton, W. O.; Barth, M.; Hegerl, R.; Baumeister, W.

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Fidelity Limits in 3-D Reconstructions - an Appraisal of Techniques for 2-D crystals

Saxton, W. O., Barth, M., Hegerl, R., & Baumeister, W. (1984). Fidelity Limits in 3-D Reconstructions - an Appraisal of Techniques for 2-D crystals.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-752C-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-752D-F

Genre: Conference Paper

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Creators:
Saxton, W. O.¹, Author
Barth, M., Author
Hegerl, R.¹, Author
Baumeister, W.¹, Author

Affiliations:
1External Organizations, ou_persistent22

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Dates: Date issued: 1984

Publication Status: Issued

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Identifiers: eDoc: 318308

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Title: 8th Europ. Congr. Electr. Micr.

Place of Event: Budapest

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