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  DNA Damage by Low-Energy Electron Impact: Dependence on Guanine Content.

Solomun, T., Seitz, H., & Sturm, H. (2009). DNA Damage by Low-Energy Electron Impact: Dependence on Guanine Content. Journal of Physical Chemistry B, 113(34), 11557-11559. doi:10.1021/jp905263x.

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Genre: Journal Article
Alternative Title : J. Phys. Chem. B

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jp905263x.pdf (Any fulltext), 704KB
 
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Solomun, T., Author
Seitz, Harald1, Author           
Sturm, H., Author
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1Dept. of Vertebrate Genomics (Head: Hans Lehrach), Max Planck Institute for Molecular Genetics, Max Planck Society, ou_1433550              

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 Abstract: Single-stranded DNA oligonucleotides (33-mers) containing different numbers of guanines (n = 1−4) were tethered to a gold surface and exposed to 1 eV electrons. The electrons induced DNA damage, which was analyzed with fluorescence and infrared spectroscopy methods. The damage was identified as strand breaks and found to correlate linearly with the number of guanines in the sequence. This sequence dependence indicates that the electron capture by the DNA bases plays an important role in the damage reaction mechanism.

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Language(s): eng - English
 Dates: 2009-08-03
 Publication Status: Issued
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Title: Journal of Physical Chemistry B
  Alternative Title : J. Phys. Chem. B
Source Genre: Journal
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Pages: - Volume / Issue: 113 (34) Sequence Number: - Start / End Page: 11557 - 11559 Identifier: ISSN: 1520-6106