A dose-rate effect in single-particle electron microscopy

Chen, James Z.; Sachse, Carsten; Xu, Chen; Mielke, Thorsten; Spahn, Christian M. T.; Grigorieff, Nikolaus

doi:10.1016/j.jsb.2007.09.017

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A dose-rate effect in single-particle electron microscopy

Chen, J. Z., Sachse, C., Xu, C., Mielke, T., Spahn, C. M. T., & Grigorieff, N. (2008). A dose-rate effect in single-particle electron microscopy. Journal of Structural Biology, 161(1), 92-100. doi:10.1016/j.jsb.2007.09.017.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-80B5-4 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-80B6-2

Genre: Zeitschriftenartikel

Alternativer Titel : J Struct Biol

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Urheber:
Chen, James Z., Autor
Sachse, Carsten, Autor
Xu, Chen, Autor
Mielke, Thorsten¹, Autor
Spahn, Christian M. T.², Autor
Grigorieff, Nikolaus, Autor

Affiliations:
1Imaging/Electron Microscopy (Head: Rudi Lurz/Thorsten Mielke), Scientific Service (Head: Manuela B. Urban), Max Planck Institute for Molecular Genetics, Max Planck Society, ou_1479668
2Dept. of Vertebrate Genomics (Head: Hans Lehrach), Max Planck Institute for Molecular Genetics, Max Planck Society, ou_1433550

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Schlagwörter: Single-particle electron cryo-microscopy, Beam-induced movement, Radiation damage, Dose-rate effect, High-resolution EM

Zusammenfassung: A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as “bubbling”. The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.