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  GRAVITY: metrology

Gillessen, S., Lippa, M., Eisenhauer, F., Pfuhl, O., Haug, M., Kellner, S., et al. (2012). GRAVITY: metrology. In F. Delplancke, J. K. Rajagopal, & F. Malbet (Eds.), Optical and Infrared Interferometry III (pp. 1-9).

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-8DB5-D Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-8DB6-B
Genre: Conference Paper

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 Creators:
Gillessen, Stefan1, Author              
Lippa, Magdalena1, Author              
Eisenhauer, Frank1, Author              
Pfuhl, Oliver1, Author              
Haug, Marcus1, Author              
Kellner, Stefan1, Author              
Ott, Thomas1, Author              
Wieprecht, Ekkehard1, Author              
Sturm, Eckhard1, Author              
Haußmann, Frank1, Author              
Kister, Clemens F.1, Author              
Moch, David1, Author              
Thiel, Markus1, Author              
Affiliations:
1Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society, ou_159889              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1117/12.926813
Other: LOCALID: AS 22/227 I, pp.84451O
 Degree: -

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Title: Optical and Infrared Interferometry III
Place of Event: Amsterdam, The Netherlands
Start-/End Date: 2012-07-01 - 2012-07-06

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Title: Optical and Infrared Interferometry III
Source Genre: Proceedings
 Creator(s):
Delplancke, Francoise, Editor
Rajagopal, Jayadev K., Editor
Malbet, Fabien, Editor
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: 84451O Start / End Page: 1 - 9 Identifier: ISBN: 978-0-8194-9146-6

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Title: Proceedings of SPIE
Source Genre: Series
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Publ. Info: Bellingham, WA, USA : Society of Photo-Optical Instrumentation Engineers
Pages: - Volume / Issue: 8445 (Part One) Sequence Number: - Start / End Page: - Identifier: ISSN: 0277-786X