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  Assessing Charge Carrier Trapping in Silicon Nanowires Using Picosecond Conductivity Measurements

Ulbricht, R., Kurstjens, R., & Bonn, M. (2012). Assessing Charge Carrier Trapping in Silicon Nanowires Using Picosecond Conductivity Measurements. Nano Letters, 12(7), 3821-3827.

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 Creators:
Ulbricht, R., Author
Kurstjens, R., Author
Bonn, Mischa1, 2, Author           
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              
2Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society, Mainz , DE, ou_1800285              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: Other: P-12-188
 Degree: -

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Title: Nano Letters
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Washington, DC : American Chemical Society
Pages: - Volume / Issue: 12 (7) Sequence Number: - Start / End Page: 3821 - 3827 Identifier: ISSN: 1530-6984
CoNE: https://pure.mpg.de/cone/journals/resource/110978984570403