Thermal properties of nanocapsules measured by scanning force microscopy methods

Kaule, T.; Hamberger, A.; Zhang, Y.; Landfester, Katharina; Butt, Hans-Jürgen; Berger, Rüdiger

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Thermal properties of nanocapsules measured by scanning force microscopy methods

Kaule, T., Hamberger, A., Zhang, Y., Landfester, K., Butt, H.-J., & Berger, R. (2012). Thermal properties of nanocapsules measured by scanning force microscopy methods. Microelectronic Engineering, 97, 223-226.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000E-B0AD-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000E-B0AF-0

Genre: Journal Article

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Creators:
Kaule, T.¹, Author
Hamberger, A.¹, Author
Zhang, Y.¹, Author
Landfester, Katharina¹, Author
Butt, Hans-Jürgen¹, Author
Berger, Rüdiger¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2012

Publication Status: Issued

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Identifiers: Other: P-12-245

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Title: Microelectronic Engineering

Source Genre: Journal

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Publ. Info: Amsterdam : Elsevier

Pages: - Volume / Issue: 97 Sequence Number: - Start / End Page: 223 - 226 Identifier: ISSN: 0167-9317
CoNE: https://pure.mpg.de/cone/journals/resource/954925484690