X-ray diffraction analysis of shape-memory transformations under load in Ni-Ti 
thin films

Schaab, J.

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X-ray diffraction analysis of shape-memory transformations under load in Ni-Ti thin films

Schaab, J. (2012). X-ray diffraction analysis of shape-memory transformations under load in Ni-Ti thin films. Diploma Thesis, Universität Stuttgart, Stuttgrat.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-000E-BD31-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-C5FE-D

Genre: Hochschulschrift

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Urheber:
Schaab, J.^{1, 2}, Autor

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497644
2Institut für Materialwissenschaft, Universität Stuttgart, Heisenbergstr. 3, 70569 Stuttgart, ou_persistent22