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  Feature Selection for Troubleshooting in Complex Assembly Lines

Pfingsten, T., Herrmann, D., Schnitzler, T., Feustel, A., & Schölkopf, B. (2007). Feature Selection for Troubleshooting in Complex Assembly Lines. IEEE Transactions on Automation Science and Engineering, 4(3), 465-469. doi:10.1109/TASE.2006.888054.

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Pfingsten, T, Author           
Herrmann, DJL, Author           
Schnitzler, T, Author
Feustel, A, Author
Schölkopf, B1, 2, Author           
Affiliations:
1Department Empirical Inference, Max Planck Institute for Biological Cybernetics, Max Planck Society, ou_1497795              
2Max Planck Institute for Biological Cybernetics, Max Planck Society, Spemannstrasse 38, 72076 Tübingen, DE, ou_1497794              

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 Abstract: The final properties of sophisticated products can
be affected by many unapparent dependencies within the manufacturing
process, and the products’ integrity can often only be
checked in a final measurement. Troubleshooting can therefore
be very tedious if not impossible in large assembly lines.
In this paper we show that Feature Selection is an efficient tool for
serial-grouped lines to reveal causes for irregularities in product
attributes. We compare the performance of several methods for
Feature Selection on real-world problems in mass-production of
semiconductor devices.
Note to Practitioners— We present a data based procedure
to localize flaws in large production lines: using the results of
final quality inspections and information about which machines
processed which batches, we are able to identify machines which
cause low yield.

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 Dates: 2007-07
 Publication Status: Published in print
 Pages: -
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 Rev. Type: -
 Identifiers: DOI: 10.1109/TASE.2006.888054
BibTex Citekey: 3611
 Degree: -

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Title: IEEE Transactions on Automation Science and Engineering
Source Genre: Journal
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Pages: - Volume / Issue: 4 (3) Sequence Number: - Start / End Page: 465 - 469 Identifier: -