Deutsch
 
Hilfe Datenschutzhinweis Impressum
  DetailsucheBrowse

Datensatz

 
 
DownloadE-Mail
  Inspection Unit for Substrate, Inspection Apparatus for Substrate and Method of Substrate Inspection using the Same

Son, H., Kim, Y., Jeon, C., & Yang, J.(2007). Inspection Unit for Substrate, Inspection Apparatus for Substrate and Method of Substrate Inspection using the Same.

Item is

Externe Referenzen

einblenden:
ausblenden:
Beschreibung:
-
OA-Status:

Urheber

einblenden:
ausblenden:
 Urheber:
Son, HI1, Autor           
Kim , YI, Autor
Jeon, CJ, Autor
Yang, JW, Autor
Affiliations:
1External Organizations, ou_persistent22              

Inhalt

einblenden:
ausblenden:
Schlagwörter: -
 Zusammenfassung: A substrate test unit, a substrate test apparatus having the same, and a substrate test method using the same are provided to fix, transfer and test a substrate, loaded from a first conveyor, by using lower rollers and fixing members corresponding to the lower rollers, and unload the substrate to a second conveyor, thereby minimizing an installation space and reducing manufacturing costs. Lower rollers(200) transfer a substrate(10) in a lower part of the substrate. A fixing member(300) is disposed so as to correspond to the lower rollers and fixes the substrate. A driving device drives the lower rollers by being coupled with the lower rollers. A test unit(400) tests the substrate transferred to a test area by the lower rollers. The fixing member includes upper rollers(310) disposed in an upper part of the substrate so as to respectively correspond to the lower rollers.

Details

einblenden:
ausblenden:
Sprache(n):
 Datum: 2006-06-082007-12-12
 Publikationsstatus: Online veröffentlicht
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: BibTex Citekey: 6476
Patentnr.: KR20070117287A
 Art des Abschluß: -

Veranstaltung

einblenden:

Entscheidung

einblenden:

Projektinformation

einblenden:

Quelle

einblenden: