TEM foil preparation of sub-micrometre sized individual grains by focused ion 
beam technique

Holzapfel, C.; Soldera, F.; Vollmer, C.; Hoppe, P.; Mücklich, F.

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TEM foil preparation of sub-micrometre sized individual grains by focused ion beam technique

Holzapfel, C., Soldera, F., Vollmer, C., Hoppe, P., & Mücklich, F. (2009). TEM foil preparation of sub-micrometre sized individual grains by focused ion beam technique. Journal of Microscopy-Oxford, 235(1), 59-66.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-829C-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-829D-6

Genre: Journal Article

Alternative Title : J. Microsc.-Oxf.

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Creators:
Holzapfel, C., Author
Soldera, F., Author
Vollmer, C.¹, Author
Hoppe, P.¹, Author
Mücklich, F., Author

Affiliations:
1Particle Chemistry, Max Planck Institute for Chemistry, Max Planck Society, ou_1826291

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Language(s): eng - English

Dates: Date issued: 2009-07

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 436647
ISI: 000267172600006

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Title: Journal of Microscopy-Oxford

Alternative Title : J. Microsc.-Oxf.

Source Genre: Journal

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Pages: - Volume / Issue: 235 (1) Sequence Number: - Start / End Page: 59 - 66 Identifier: ISSN: 0022-2720