English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Distributed Skyline Processing: a Trend in Database Research Still Going Strong

Hose, K., & Vlachou, A. (2012). Distributed Skyline Processing: a Trend in Database Research Still Going Strong. In E. Rundensteiner, V. Markl, I. Manolescu, S. Amer-Yahia, F. Naumann, & I. Ari (Eds.), Advances in Database Technology - EDBT 2012 (pp. 558-561). New York, NY: ACM.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-5DFD-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C14D-8
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Hose, Katja1, Author           
Vlachou, Akrivi2, Author
Affiliations:
1Databases and Information Systems, MPI for Informatics, Max Planck Society, ou_24018              
2External Organizations, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 647456
DOI: 10.1145/2247596.2247665
URI: http://doi.acm.org/10.1145/2247596.2247665
Other: Local-ID: C1256DBF005F876D-4EF755740179C6C8C12579E6005EABDB-HoseEDBT2012
BibTex Citekey: HoseEDBT2012
 Degree: -

Event

show
hide
Title: 15th International Conference on Extending Database Technology
Place of Event: Scottsdale, Arizona, USA
Start-/End Date: 2012-04-20 - 2012-04-20

Legal Case

show

Project information

show

Source 1

show
hide
Title: Advances in Database Technology - EDBT 2012
  Subtitle : 15th International Conference on Extending Database Technology
  Latex : Advances in Database Technology -- {EDBT 2012}
Source Genre: Proceedings
 Creator(s):
Rundensteiner, Elke, Editor
Markl, Volker, Editor
Manolescu, Ioana, Editor
Amer-Yahia, Sihem, Editor
Naumann, Felix, Editor
Ari, Ismail, Editor
Affiliations:
-
Publ. Info: New York, NY : ACM
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 558 - 561 Identifier: ISBN: 978-1-4503-0790-1