Profiling structured beams using injected aerosols

Loh, N. D.; Starodub, Dmitri; Lomb, Lukas; Hampton, Christina Y.; Martin, Andrew V.; Sierra, Raymond G.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Günther; Holl, Peter; Pedersoli, Emanuele; Liang, MengNing; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsman, Heinz; Maia, Filipe R. N. C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; White, Thomas A.; Tobias, Herbert J.; Farquar, George R.; Benner, W. Henry; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Hodgson, Keith O.; Frank, Mathias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.

doi:doi:10.1117/12.930075

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Profiling structured beams using injected aerosols

Loh, N. D., Starodub, D., Lomb, L., Hampton, C. Y., Martin, A. V., Sierra, R. G., et al. (2012). Profiling structured beams using injected aerosols. In Proceedings of SPIE. SPIE © 1962 - 2013. All Rights Reserved. doi:doi:10.1117/12.930075.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-736E-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-736F-3

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http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1381227 (Publisher version) Open Access status unknown

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Creators:
Loh, N. D., Author
Starodub, Dmitri, Author
Lomb, Lukas, Author
Hampton, Christina Y., Author
Martin, Andrew V., Author
Sierra, Raymond G., Author
Barty, Anton, Author
Aquila, Andrew, Author
Schulz, Joachim, Author
Steinbrener, Jan, Author
Shoeman, Robert L., Author
Kassemeyer, Stephan, Author
Bostedt, Christoph, Author
Bozek, John, Author
Epp, Sascha W.¹, Author
Erk, Benjamin², Author
Hartmann, Robert, Author
Rolles, Daniel², Author
Rudenko, Artem¹, Author
Rudek, Benedikt², Author
Foucar, Lutz², Author         Kimmel, Nils, AuthorWeidenspointner, Georg, AuthorHauser, Günther, AuthorHoll, Peter, AuthorPedersoli, Emanuele, AuthorLiang, MengNing, AuthorHunter, Mark S., AuthorGumprecht, Lars, AuthorCoppola, Nicola, AuthorWunderer, Cornelia, AuthorGraafsman, Heinz, AuthorMaia, Filipe R. N. C., AuthorEkeberg, Tomas, AuthorHantke, Max, AuthorFleckenstein, Holger, AuthorHirsemann, Helmut, AuthorNass, Karol, AuthorWhite, Thomas A., AuthorTobias, Herbert J., AuthorFarquar, George R., AuthorBenner, W. Henry, AuthorHau-Riege, Stefan, AuthorReich, Christian, AuthorHartmann, Andreas, AuthorSoltau, Heike, AuthorMarchesini, Stefano, AuthorBajt, Sasa, AuthorBarthelmess, Miriam, AuthorStrueder, Lothar, AuthorUllrich, Joachim³, Author         Bucksbaum, Philip, AuthorHodgson, Keith O., AuthorFrank, Mathias, AuthorSchlichting, Ilme, AuthorChapman, Henry N., AuthorBogan, Michael J., Author more..

Affiliations:
1External Organizations, ou_persistent22
2Department of Biomolecular Mechanisms, ou_1497700
3Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547

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Abstract: Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied. © (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

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Language(s): eng - English

Dates: Published Online: 2012-10-19

Publication Status: Published online

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Identifiers: DOI: doi:10.1117/12.930075

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Title: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications

Place of Event: San Diego, California, USA

Start-/End Date: 2012-08-13 - 2012-08-16

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Title: Proceedings of SPIE

Source Genre: Proceedings

Creator(s):
Moeller, Stefan P., Author
Yabashi, Makina, Author
Hau-Riege, Stefan P.¹, Author

Affiliations:
1 External Organizations, ou_persistent22

Pages: - Volume / Issue: 8504 Sequence Number: 850403 Start / End Page: - Identifier: CoNE: https://pure.mpg.de/cone/journals/resource/111097776606042