Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity 
Analyzer

Hecht, M. H.; Marshall, J.; Pike, W. T.; Staufer, U.; Blaney, D.; Braendlin, D.; Gautsch, S.; Goetz, W.; Hidber, H.-R.; Keller, H. U.; Markiewicz, W. J.; Mazer, A.; Meloy, T. P.; Morookian, J. M.; Mogensen, C.; Parrat, D.; Smith, P.; Sykulska, H.; Tanner, R. J.; Reynolds, R. O.; Tonin, A.; Vijendran, S.; Weilert, M.; Woida, P. M.

doi:10.1029/2008JE003077

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Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer

Hecht, M. H., Marshall, J., Pike, W. T., Staufer, U., Blaney, D., Braendlin, D., et al. (2008). Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer. Journal Geophysical Research, 113: E00A22. doi:10.1029/2008JE003077.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-0013-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0007-2CB2-F

Genre: Journal Article

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Creators:
Hecht, M. H., Author
Marshall, J., Author
Pike, W. T., Author
Staufer, U., Author
Blaney, D., Author
Braendlin, D., Author
Gautsch, S., Author
Goetz, W.¹, Author
Hidber, H.-R., Author
Keller, H. U.^{1, 2}, Author
Markiewicz, W. J.^{1, 2}, Author
Mazer, A., Author
Meloy, T. P., Author
Morookian, J. M., Author
Mogensen, C., Author
Parrat, D., Author
Smith, P., Author
Sykulska, H., Author
Tanner, R. J., Author
Reynolds, R. O., Author
Tonin, A., AuthorVijendran, S., AuthorWeilert, M., AuthorWoida, P. M., Author more..

Affiliations:
1Department Planets and Comets, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832288
2MPI for Aeronomy, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832291

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MPIS_GROUPS: Planets and Comets

MPIS_PROJECTS: Venus Express

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Dates: Date issued: 2008

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1029/2008JE003077
BibTex Citekey: Hecht:2008-180

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Title: Journal Geophysical Research

Source Genre: Journal

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Pages: - Volume / Issue: 113 Sequence Number: E00A22 Start / End Page: - Identifier: -