Hecht, M. H., Marshall, J., Pike, W. T., Staufer, U., Blaney, D., Braendlin, D., Gautsch, S., Goetz, W., Hidber, H.-R., Keller, H. U., Markiewicz, W. J., Mazer, A., Meloy, T. P., Morookian, J. M., Mogensen, C., Parrat, D., Smith, P., Sykulska, H., Tanner, R. J., Reynolds, R. O., Tonin, A., Vijendran, S., Weilert, M., & Woida, P. M. (2008). Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer. Journal Geophysical Research, 113:. doi:10.1029/2008JE003077.