UV-Laser Desorption Ion Source Applied to a Secondary Ion Mass Spectrometer

Hilchenbach, M.; Lang, T.; Hornung, K.; Thirkell, L.; Briois, C.

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UV-Laser Desorption Ion Source Applied to a Secondary Ion Mass Spectrometer

Hilchenbach, M., Lang, T., Hornung, K., Thirkell, L., & Briois, C. (2009). UV-Laser Desorption Ion Source Applied to a Secondary Ion Mass Spectrometer. In 40th Lunar and Planetary Science Conference, (Lunar and Planetary Science XL), held March 23-27, 2000 in The Woodlands, Texas.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-01C2-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-D456-A

Genre: Conference Paper

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Creators:
Hilchenbach, M.¹, Author
Lang, T., Author
Hornung, K., Author
Thirkell, L., Author
Briois, C., Author

Affiliations:
1MPI for Aeronomy, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832291

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MPIS_PROJECTS: ROSETTA: COSIMA

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Dates: Date issued: 2009

Publication Status: Issued

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Rev. Type: No review

Identifiers: BibTex Citekey: Hilchenbach:2009-129

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Title: 40th Lunar and Planetary Science Conference, (Lunar and Planetary Science XL), held March 23-27, 2000 in The Woodlands, Texas

Source Genre: Proceedings

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