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  Perturbation approach applied to modal diffraction methods

Bischoff, J., & Hehl, K. (2011). Perturbation approach applied to modal diffraction methods. J. Opt. Soc. Am. A-Opt. Image Sci. Vis., 28(5), 859-867.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-0AA4-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-0AA5-9
Genre: Journal Article

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 Creators:
Bischoff, Joerg1, Author              
Hehl, Karl, Author
Affiliations:
1Department Sun and Heliosphere, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832289              

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 MPIS_GROUPS: Sun and Heliosphere
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 Dates: 2011
 Publication Status: Published in print
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 Rev. Type: Peer
 Identifiers: BibTex Citekey: Bischoff:2011-329
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Title: J. Opt. Soc. Am. A-Opt. Image Sci. Vis.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 28 (5) Sequence Number: - Start / End Page: 859 - 867 Identifier: -