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  Irradiation damage tests on backside-illuminated CMOS APS prototypes for the Extreme Ultraviolet Imager on-board Solar Orbiter

BenMoussa, A., Gissot, S., Giordanengo, B., Meynants, G., Wang, X., Wolfs, B., et al. (2013). Irradiation damage tests on backside-illuminated CMOS APS prototypes for the Extreme Ultraviolet Imager on-board Solar Orbiter. IEEE Transactions on Nuclear Science, 60, 3907-3914. doi:10.1109/TNS.2013.2279550.

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 Creators:
BenMoussa, A., Author
Gissot, S., Author
Giordanengo, B., Author
Meynants, G., Author
Wang, X., Author
Wolfs, B., Author
Bogaerts, J., Author
Schühle, U.1, 2, Author           
Berger, G., Author
Gottwald, A., Author
Laubis, C., Author
Kroth, U., Author
Scholze, F., Author
Soltani, A., Author
Saito, T., Author
Affiliations:
1MPI for Aeronomy, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832291              
2Department Sun and Heliosphere, Max Planck Institute for Solar System Research, Max Planck Society, ou_1832289              

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 MPIS_GROUPS: Sun and Heliosphere
 MPIS_PROJECTS: SOLAR ORBITER
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 Dates: 2013
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1109/TNS.2013.2279550
BibTex Citekey: BenMoussa:2013-113
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Title: IEEE Transactions on Nuclear Science
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 60 Sequence Number: - Start / End Page: 3907 - 3914 Identifier: -