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  Universal scaling of nonlinear conductance in the two-channel pseudogap Anderson model: Application for gate-tuned Kondo effect in magnetically doped graphene

Lee, T.-H., Zhang, K.-Y.-J., Chung, C.-H., & Kirchner, S. (2013). Universal scaling of nonlinear conductance in the two-channel pseudogap Anderson model: Application for gate-tuned Kondo effect in magnetically doped graphene. Pysical Review B, 88(8): 085431, pp. 085431-1-085431-7. doi:10.1103/PhysRevB.88.085431.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-1E70-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-1E71-F
Genre: Journal Article

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 Creators:
Lee, T.-H., Author
Zhang, K. Y.-J., Author
Chung, C.-H., Author
Kirchner, S.1, Author              
Affiliations:
1Stefan Kirchner, cross-PKS/CPfS theory group, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863475              

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 Abstract: Based on the noncrossing approximation, we calculate both the linear and nonlinear conductance within the two-lead two-channel single-impurity Anderson model where the conduction electron density of states vanishes in a power-law fashion proportional to vertical bar omega - mu(F)vertical bar(r) with r = 1 near the Fermi energy, appropriate for a hexagonal system. For given gate voltage, we address the universal crossover from a two-channel Kondo phase, argued to occur in doped graphene, to an unscreened local moment phase. We extract universal scaling functions in conductance governing charge transfer through the two-channel pseudogap Kondo impurity and discuss our results in the context of a recent scanning tunneling spectroscopy experiment on Co-doped graphene.

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Language(s): eng - English
 Dates: 2013-08-26
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 670771
ISI: 000323573600008
DOI: 10.1103/PhysRevB.88.085431
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Title: Pysical Review B
Source Genre: Journal
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Pages: - Volume / Issue: 88 (8) Sequence Number: 085431 Start / End Page: 085431-1 - 085431-7 Identifier: ISSN: 1098-0121