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  Fabrication and characterization of semiconducting half-Heusler YPtSb thin films

Shan, R., Vilanova, E. V., Qin, J., Casper, F., Fecher, G. H., Jakob, G., et al. (2013). Fabrication and characterization of semiconducting half-Heusler YPtSb thin films. Physica Status Solidi RRL, 7(1-2), 145-147. doi:10.1002/pssr.201206413.

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 Creators:
Shan, R., Author
Vilanova, E. V., Author
Qin, J., Author
Casper, F., Author
Fecher, G. H.1, Author              
Jakob, G., Author
Felser, C.2, Author              
Affiliations:
1Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863431              
2Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863429              

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Language(s): eng - English
 Dates: 2013-02-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 636520
DOI: 10.1002/pssr.201206413
 Degree: -

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Title: Physica Status Solidi RRL
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 7 (1-2) Sequence Number: - Start / End Page: 145 - 147 Identifier: ISSN: 1862-6254