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  Hard X-ray photoelectron spectroscopy on buried, off-stoichiometric CoxMnyGez (x : z = 2 : 0.38) Heusler thin films

Ouardi, S., Fecher, G. H., Chadov, S., Balke, B., Kozina, X., Felser, C., et al. (2013). Hard X-ray photoelectron spectroscopy on buried, off-stoichiometric CoxMnyGez (x: z = 2: 0.38) Heusler thin films. Applied Physics A, 111(2), 395-405. doi:10.1007/s00339-013-7565-y.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-1F98-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-1F99-2
Genre: Journal Article

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 Creators:
Ouardi, S.1, Author              
Fecher, G. H.2, Author              
Chadov, S.3, Author              
Balke, B., Author
Kozina, X., Author
Felser, C.4, Author              
Taira, T., Author
Yamamoto, M., Author
Affiliations:
1Siham Ouardi, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863439              
2Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863431              
3Stanislav Chadov, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863440              
4Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863429              

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Language(s): eng - English
 Dates: 2013-01-25
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 656162
DOI: 10.1007/s00339-013-7565-y
 Degree: -

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Title: Applied Physics A
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 111 (2) Sequence Number: - Start / End Page: 395 - 405 Identifier: ISSN: 0947-8396