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  Structure determination of thin CoFe films by anomalous x-ray diffraction

Gloskovskii, A., Stryganyuk, G., Ouardi, S., Fecher, G. H., Felser, C., Hamrle, J., et al. (2012). Structure determination of thin CoFe films by anomalous x-ray diffraction. Journal of Applied Physics, 112(7): 074903, pp. 074903-1-074903-3. doi:10.1063/1.4755801.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-202C-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-202D-D
Genre: Journal Article

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 Creators:
Gloskovskii, A., Author
Stryganyuk, G., Author
Ouardi, S.1, Author              
Fecher, G. H.2, Author              
Felser, C.3, Author              
Hamrle, J., Author
Pištora, J., Author
Bosu, S., Author
Saito, K., Author
Sakuraba, Y., Author
Takanashi, K., Author
Affiliations:
1Siham Ouardi, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863439              
2Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863431              
3Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863429              

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Language(s): eng - English
 Dates: 2012-10-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 629475
DOI: 10.1063/1.4755801
 Degree: -

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Title: Journal of Applied Physics
Source Genre: Journal
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Pages: - Volume / Issue: 112 (7) Sequence Number: 074903 Start / End Page: 074903-1 - 074903-3 Identifier: ISSN: 0021-8979