Quantitative High-Angle Annular Dark-Field Scanning Transmission Electron 
Microscope (HAADF-STEM) Tomography and High- Resolution Electron Microscopy of 
Unsupported Intermetallic GaPd2 Catalysts

Leary, R.; Saghi, Z.; Armbrüster, M.; Wowsnick, G.; Schlögl, R.; Thomas, J. M.; Midgley, P. A.

doi:10.1021/jp212456z

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Quantitative High-Angle Annular Dark-Field Scanning Transmission Electron Microscope (HAADF-STEM) Tomography and High- Resolution Electron Microscopy of Unsupported Intermetallic GaPd₂ Catalysts

Leary, R., Saghi, Z., Armbrüster, M., Wowsnick, G., Schlögl, R., Thomas, J. M., et al. (2012). Quantitative High-Angle Annular Dark-Field Scanning Transmission Electron Microscope (HAADF-STEM) Tomography and High- Resolution Electron Microscopy of Unsupported Intermetallic GaPd₂ Catalysts. The Journal of Physical Chemistry C, 116(24), 13343-13352. doi:10.1021/jp212456z.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-20E9-3 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-9C49-B

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Urheber:
Leary, R., Autor
Saghi, Z., Autor
Armbrüster, M.¹, Autor
Wowsnick, G.², Autor
Schlögl, R., Autor
Thomas, J. M., Autor
Midgley, P. A., Autor

Affiliations:
1Marc Armbrüster, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863414
2Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404