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  Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy

Chu, Y. Y., Liao, Y. F., Tra, V. T., Yang, J. C., Liu, W. Z., Chu, Y. H., et al. (2011). Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy. Applied Physics Letters, 99(26): 262101, pp. 1-3. doi:10.1063/1.3672099.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-2182-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-AF27-E
Genre: Journal Article

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 Creators:
Chu, Y. Y., Author
Liao, Y. F., Author
Tra, V. T., Author
Yang, J. C., Author
Liu, W. Z., Author
Chu, Y. H., Author
Lin, J. Y., Author
Huang, J. H., Author
Weinen, J.1, Author              
Agrestini, S.2, Author              
Tsuei, K.-D., Author
Huang, D. J., Author
Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445              
2Stefano Agrestini, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863459              

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Language(s): eng - English
 Dates: 2011-12-27
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 582177
DOI: 10.1063/1.3672099
 Degree: -

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Title: Applied Physics Letters
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 99 (26) Sequence Number: 262101 Start / End Page: 1 - 3 Identifier: ISSN: 0003-6951