Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface 
revealed by hard x-ray photoemission spectroscopy

Chu, Y. Y.; Liao, Y. F.; Tra, V. T.; Yang, J. C.; Liu, W. Z.; Chu, Y. H.; Lin, J. Y.; Huang, J. H.; Weinen, J.; Agrestini, S.; Tsuei, K.-D.; Huang, D. J.

doi:10.1063/1.3672099

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Distribution of electronic reconstruction at the n-type LaAlO₃/SrTiO₃ interface revealed by hard x-ray photoemission spectroscopy

Chu, Y. Y., Liao, Y. F., Tra, V. T., Yang, J. C., Liu, W. Z., Chu, Y. H., et al. (2011). Distribution of electronic reconstruction at the n-type LaAlO₃/SrTiO₃ interface revealed by hard x-ray photoemission spectroscopy. Applied Physics Letters, 99(26): 262101, pp. 1-3. doi:10.1063/1.3672099.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2182-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-AF27-E

Genre: Journal Article

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Creators:
Chu, Y. Y., Author
Liao, Y. F., Author
Tra, V. T., Author
Yang, J. C., Author
Liu, W. Z., Author
Chu, Y. H., Author
Lin, J. Y., Author
Huang, J. H., Author
Weinen, J.¹, Author
Agrestini, S.², Author
Tsuei, K.-D., Author
Huang, D. J., Author

Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445
2Stefano Agrestini, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863459

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Language(s): eng - English

Dates: Date issued: 2011-12-27

Publication Status: Issued

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Identifiers: eDoc: 582177
DOI: 10.1063/1.3672099

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 99 (26) Sequence Number: 262101 Start / End Page: 1 - 3 Identifier: ISSN: 0003-6951