Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface 
revealed by hard x-ray photoemission spectroscopy

Chu, Y. Y.; Liao, Y. F.; Tra, V. T.; Yang, J. C.; Liu, W. Z.; Chu, Y. H.; Lin, J. Y.; Huang, J. H.; Weinen, J.; Agrestini, S.; Tsuei, K.-D.; Huang, D. J.

doi:10.1063/1.3672099

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Distribution of electronic reconstruction at the n-type LaAlO₃/SrTiO₃ interface revealed by hard x-ray photoemission spectroscopy

Chu, Y. Y., Liao, Y. F., Tra, V. T., Yang, J. C., Liu, W. Z., Chu, Y. H., et al. (2011). Distribution of electronic reconstruction at the n-type LaAlO₃/SrTiO₃ interface revealed by hard x-ray photoemission spectroscopy. Applied Physics Letters, 99(26): 262101, pp. 1-3. doi:10.1063/1.3672099.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2182-1 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-AF27-E

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Urheber:
Chu, Y. Y., Autor
Liao, Y. F., Autor
Tra, V. T., Autor
Yang, J. C., Autor
Liu, W. Z., Autor
Chu, Y. H., Autor
Lin, J. Y., Autor
Huang, J. H., Autor
Weinen, J.¹, Autor
Agrestini, S.², Autor
Tsuei, K.-D., Autor
Huang, D. J., Autor

Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445
2Stefano Agrestini, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863459