Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr
0.5Hf0.5Sn thin films by hard x-ray photoelectron spectroscopy

Kozina, X.; Jaeger, T.; Ouardi, S.; Gloskowskij, A.; Stryganyuk, G.; Jakob, G.; Sugiyama, T.; Ikenaga, E.; Fecher, G. H.; Felser, C.

doi:10.1063/1.3665621

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Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr_0.5Hf_0.5Sn thin films by hard x-ray photoelectron spectroscopy

Kozina, X., Jaeger, T., Ouardi, S., Gloskowskij, A., Stryganyuk, G., Jakob, G., et al. (2011). Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr_0.5Hf_0.5Sn thin films by hard x-ray photoelectron spectroscopy. Applied Physics Letters, 99(22): 221908, pp. 221908-1-221908-3. doi:10.1063/1.3665621.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2194-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2195-8

Genre: Journal Article

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Kozina, X., Author
Jaeger, T., Author
Ouardi, S.¹, Author
Gloskowskij, A., Author
Stryganyuk, G., Author
Jakob, G., Author
Sugiyama, T., Author
Ikenaga, E., Author
Fecher, G. H.², Author
Felser, C.³, Author

Affiliations:
1Siham Ouardi, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863439
2Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863431
3Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863429

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Language(s): eng - English

Dates: Date issued: 2011-11-30

Publication Status: Issued

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Identifiers: eDoc: 576545
DOI: 10.1063/1.3665621

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 99 (22) Sequence Number: 221908 Start / End Page: 221908-1 - 221908-3 Identifier: ISSN: 0003-6951