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  Skyrmion lattice in the doped semiconductor Fe1-xCoxSi

Münzer, W., Neubauer, A., Adams, T., Mühlbauer, S., Franz, C., Jonietz, F., et al. (2010). Skyrmion lattice in the doped semiconductor Fe1-xCoxSi. Physical Review B, 81: 041203, pp. 041203-1-041203-4. doi:10.1103/PhysRevB.81.041203.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-250C-9 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-F5B3-D
Genre: Journal Article

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 Creators:
Münzer, W., Author
Neubauer, A., Author
Adams, T., Author
Mühlbauer, S., Author
Franz, C., Author
Jonietz, F., Author
Georgii, R., Author
Böni, P., Author
Pedersen, B., Author
Schmidt, M.1, Author              
Rosch, A., Author
Pfleiderer, C., Author
Affiliations:
1Marcus Schmidt, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863415              

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Language(s): eng - English
 Dates: 2010-01-20
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: eDoc: 460451
ISI: 000274002500005
DOI: 10.1103/PhysRevB.81.041203
 Degree: -

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Title: Physical Review B
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 81 Sequence Number: 041203 Start / End Page: 041203-1 - 041203-4 Identifier: ISSN: 1098-0121