Relationship between composition and charge carrier concentration in Eu8Ga16-xGe
30+x clathrates

Pacheco, V.; Bentien, A.; Carrillo-Cabrera, W.; Paschen, S.; Steglich, F.; Grin, Y.

doi:10.1103/PhysRevB.71.165205

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Relationship between composition and charge carrier concentration in Eu₈Ga_16-xGe_30+x clathrates

Pacheco, V., Bentien, A., Carrillo-Cabrera, W., Paschen, S., Steglich, F., & Grin, Y. (2005). Relationship between composition and charge carrier concentration in Eu₈Ga_16-xGe_30+x clathrates. Physical Review B, 71, 165205-1-165205-10. doi:10.1103/PhysRevB.71.165205.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2C57-B Version Permalink: https://hdl.handle.net/21.11116/0000-0000-4002-5

Genre: Journal Article

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Creators:
Pacheco, V.¹, Author
Bentien, A.¹, Author
Carrillo-Cabrera, W.², Author
Paschen, S.¹, Author
Steglich, F.³, Author
Grin, Y.⁴, Author

Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404
2Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863405
3Frank Steglich, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863467
4Juri Grin, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863413

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Identifiers: eDoc: 228800
DOI: 10.1103/PhysRevB.71.165205

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Title: Physical Review B

Source Genre: Journal

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Pages: - Volume / Issue: 71 Sequence Number: - Start / End Page: 165205-1 - 165205-10 Identifier: -