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  Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi2B2C Thin Film

Cao, G. H., Skrotzki, W., Simon, P., Wimbush, S. C., & Holzapfel, B. (2005). Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi2B2C Thin Film. Chemistry of Materials, 17, 3558-3562. doi:10.1021/cm050006t.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-2CC3-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-EC7B-1
Genre: Journal Article

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 Creators:
Cao, G. H., Author
Skrotzki, W., Author
Simon, P.1, Author              
Wimbush, S. C., Author
Holzapfel, B., Author
Affiliations:
1Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863418              

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Language(s): eng - English
 Dates: 2005
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 241958
DOI: 10.1021/cm050006t
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Title: Chemistry of Materials
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 17 Sequence Number: - Start / End Page: 3558 - 3562 Identifier: -