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  Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling

Volkert, C. A., Busch, S., Heiland, B., & Dehm, G. (2004). Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy, 214, 208-212. doi:10.1111/j.0022-2720.2004.01352.x.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-2DE6-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0018-BE98-B
Genre: Journal Article

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 Creators:
Volkert, C. A., Author
Busch, S.1, Author              
Heiland, B., Author
Dehm, G., Author
Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404              

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Free keywords: apatite; FIB; focused ion beam milling; TEM sample preparation; tooth enamel; ultramicrotomy
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Language(s): eng - English
 Dates: 2004-06
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Degree: -

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Title: Journal of Microscopy
  Alternative Title : J. Microsc.-Oxf.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 214 Sequence Number: - Start / End Page: 208 - 212 Identifier: ISSN: 0022-2720