On the electronic and structural properties of aluminum diboride Al0.9B2

Burkhardt, U.; Gurin, V.; Haarmann, F.; Borrmann, H.; Schnelle, W.; Yaresko, A.; Grin, Y.

doi:10.1016/j.jssc.2002.12.001

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On the electronic and structural properties of aluminum diboride Al_0.9B₂

Burkhardt, U., Gurin, V., Haarmann, F., Borrmann, H., Schnelle, W., Yaresko, A., et al. (2004). On the electronic and structural properties of aluminum diboride Al_0.9B₂. Journal of Solid State Chemistry, 177(2), 389-394. doi:10.1016/j.jssc.2002.12.001.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2E58-C Version Permalink: https://hdl.handle.net/21.11116/0000-0000-1833-C

Genre: Journal Article

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Creators:
Burkhardt, U.¹, Author
Gurin, V.², Author
Haarmann, F.³, Author
Borrmann, H.⁴, Author
Schnelle, W.⁵, Author
Yaresko, A.², Author
Grin, Y.⁶, Author

Affiliations:
1Ulrich Burkhardt, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863422
2Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404
3Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863405
4Horst Borrmann, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863410
5Walter Schnelle, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863441
6Juri Grin, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863413

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Free keywords: aluminum diboride; defect crystal structure; density; NMR measurements; electrical resistivity; Hall-coefficient; chemical bonding

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Language(s): eng - English

Dates: Date issued: 2004-02

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 219528
ISI: 000189158200003
DOI: 10.1016/j.jssc.2002.12.001

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Title: Journal of Solid State Chemistry

Alternative Title : J. Solid State Chem.

Source Genre: Journal

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Pages: - Volume / Issue: 177 (2) Sequence Number: - Start / End Page: 389 - 394 Identifier: ISSN: 0022-4596