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  Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO

Cao, G. H., Simon, P., Krämer, U., Wimbush, S. C., & Holzapfel, B. (2004). Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO. Chemistry of Materials, 16(5), 842-845. doi:10.1021/cm031044k.

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 Creators:
Cao, G. H., Author
Simon, P.1, Author              
Krämer, U., Author
Wimbush, S. C., Author
Holzapfel, B., Author
Affiliations:
1Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863418              

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Language(s): eng - English
 Dates: 2004
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 225776
DOI: 10.1021/cm031044k
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Title: Chemistry of Materials
Source Genre: Journal
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Pages: - Volume / Issue: 16 (5) Sequence Number: - Start / End Page: 842 - 845 Identifier: -