Transmission Electron Microscopy and High-Resolution Electron Microscopy Study 
of YNi2B2C Thin Film on Y2O3-Buffered MgO

Cao, G. H.; Simon, P.; Krämer, U.; Wimbush, S. C.; Holzapfel, B.

doi:10.1021/cm031044k

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Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi₂B₂C Thin Film on Y₂O₃-Buffered MgO

Cao, G. H., Simon, P., Krämer, U., Wimbush, S. C., & Holzapfel, B. (2004). Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi₂B₂C Thin Film on Y₂O₃-Buffered MgO. Chemistry of Materials, 16(5), 842-845. doi:10.1021/cm031044k.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2F35-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-001A-32F2-C

Genre: Journal Article

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Creators:
Cao, G. H., Author
Simon, P.¹, Author
Krämer, U., Author
Wimbush, S. C., Author
Holzapfel, B., Author

Affiliations:
1Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863418

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Language(s): eng - English

Dates: Date issued: 2004

Publication Status: Issued

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Identifiers: eDoc: 225776
DOI: 10.1021/cm031044k

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Title: Chemistry of Materials

Source Genre: Journal

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Pages: - Volume / Issue: 16 (5) Sequence Number: - Start / End Page: 842 - 845 Identifier: -