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  YbRh2Si2: Spin Fluctuations in the Vicinity of a Quantum Critical Point at Low Magnetic Field

Ishida, K., Okamoto, K., Kawasaki, Y., Kitaoka, Y., Trovarelli, O., Geibel, C., et al. (2002). YbRh2Si2: Spin Fluctuations in the Vicinity of a Quantum Critical Point at Low Magnetic Field. Physical Review Letters, 89(10): 107202, pp. 107202-107202. doi:10.1103/PhysRevLett.89.107202.

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Ishida, K., Author
Okamoto, K., Author
Kawasaki, Y., Author
Kitaoka, Y., Author
Trovarelli, O.1, Author           
Geibel, C.2, Author           
Steglich, F.3, Author           
Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404              
2Christoph Geibel, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863465              
3Frank Steglich, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863467              

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 Abstract: We report a Si-29 NMR study on aligned single crystals of YbRh2Si2 which shows behavior characteristic of a quantum critical point (QCP: T-N-->0). The Knight shift K and the nuclear spin-lattice relaxation rate 1/T-1 of Si show a strong dependence on the external field H, especially below 5 kOe. At the lowest H used in this measurement (Hsimilar to1.5 kOe), it was found that 1/T1T continues to increase down to 50 mK, whereas K stays constant with a large magnitude below 200 mK. This result strongly suggests the development of antiferromagnetic fluctuations with finite q vectors that compete with q=0 spin fluctuations in the vicinity of the QCP near H=0.5 kOe.

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Language(s): eng - English
 Dates: 2002-09-02
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 17434
ISI: 000177582600045
DOI: 10.1103/PhysRevLett.89.107202
 Degree: -

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Title: Physical Review Letters
  Alternative Title : Phys. Rev. Lett.
Source Genre: Journal
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Pages: - Volume / Issue: 89 (10) Sequence Number: 107202 Start / End Page: 107202 - 107202 Identifier: ISSN: 0031-9007