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  Ion bunch stacking in a Penning trap after purification in an electrostatic mirror trap

Rosenbusch, M., Atanasov, D., Blaum, K., Borgmann, C., Kreim, S., Lunney, D., Manea, V., Schweikhard, L., Wienholtz, F., & Wolf, R. N. (2014). Ion bunch stacking in a Penning trap after purification in an electrostatic mirror trap. Applied Physics B: Lasers and Optics, 114(1-2), 147-155. doi:10.1007/s00340-013-5702-0.

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資料種別: 学術論文

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 作成者:
Rosenbusch, M.1, 著者
Atanasov, Dinko2, 著者           
Blaum, Klaus2, 著者           
Borgmann, Christopher2, 著者           
Kreim, Susanne2, 3, 著者           
Lunney, D.4, 著者
Manea, V.4, 著者
Schweikhard, Lutz1, 著者
Wienholtz, F.1, 著者
Wolf, Robert N.1, 著者
所属:
1Institut für Physik, Ernst-Moritz-Arndt-Universität, 17487 Greifswald, Germany, ou_persistent22              
2Division Prof. Dr. Klaus Blaum, MPI for Nuclear Physics, Max Planck Society, ou_904548              
3CERN, 1211 Geneva 23, Switzerland, ou_persistent22              
4CSNSM/IN2P3, Université de Paris Sud, 91405 Orsay, France, ou_persistent22              

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キーワード: -
 MPINP: Speichertechnik - Abteilung Blaum
 要旨: The success of many measurements in analytical mass spectrometry as well as in precision mass determinations for atomic and nuclear physics is handicapped when the ion sources deliver “contaminations”, i.e., unwanted ions of masses similar to those of the ions of interest. In particular, in ion-trapping devices, large amounts of contaminant ions result in significant systematic errors—if the measurements are possible at all. We present a solution for such cases: The ions from a quasi-continuous source are bunched in a linear radio-frequency-quadrupole ion trap, separated by a multi-reflection time-of-flight section followed by a Bradbury–Nielsen gate, and then captured in a Penning trap. Buffer-gas cooling is used to damp the ion motion in the latter, which allows a repeated opening of the Penning trap for a stacking of mass-selected ion bunches. Proof-of-principle demonstrations have been performed with the ISOLTRAP setup at ISOLDE/CERN, both with 133Cs+ ions from an off-line ion source and by application to an on-line beam of 179Lu+ ions contaminated with 163Dy16O+ ions. In addition, an optimization of the experimental procedure is given, in particular for the number of ion bunches captured as a function of the ions’ lifetimes and the parameters of the experiment .

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言語: eng - English
 日付: 2014-01-01
 出版の状態: 出版
 ページ: 9
 出版情報: -
 目次: -
 査読: 査読あり
 識別子(DOI, ISBNなど): DOI: 10.1007/s00340-013-5702-0
 学位: -

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出版物 1

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出版物名: Applied Physics B: Lasers and Optics
  その他 : Appl. Phys. B: Lasers O.
種別: 学術雑誌
 著者・編者:
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出版社, 出版地: Heidelberg : Springer-Verlag
ページ: - 巻号: 114 (1-2) 通巻号: - 開始・終了ページ: 147 - 155 識別子(ISBN, ISSN, DOIなど): ISSN: 0946-2171
CoNE: https://pure.mpg.de/cone/journals/resource/954928582870