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  Emission and Laser Spectroscopy of Trapped Highly Charged Ions in Electron Beam Ion Traps

Crespo López-Urrutia, J. R., & Harman, Z. (2014). Emission and Laser Spectroscopy of Trapped Highly Charged Ions in Electron Beam Ion Traps. In W. Quint, & M. Vogel (Eds.), Fundamental Physics in Particle Traps (pp. 315-373). Berlin u.a.: Springer.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-3A6E-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-3A6F-8
Genre: Book Chapter

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 Creators:
Crespo López-Urrutia, José Ramón1, Author              
Harman, Zoltan2, Author              
Affiliations:
1Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              
2Division Prof. Dr. Christoph H. Keitel, MPI for Nuclear Physics, Max Planck Society, ou_904546              

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 MPINP: Research group Z. Harman – Division C. H. Keitel
 Abstract: Research with highly charged ions addresses bound state quantum electrodynamics and relativistic atomic theory at their frontiers. Electron beam ion traps have provided practical means to study not only these fundamental fields, but also the physics of extremely hot plasmas in stars, active galactic nuclei, and fusion research plasma devices. Starting from the X-ray region, where the first experiments took place, this chapter will visit various regions of the electromagnetic spectrum and give a review of essential contributions of different groups to this field.

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 Dates: 2014-02
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1007/978-3-642-45201-7_10
 Degree: -

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Title: Fundamental Physics in Particle Traps
Source Genre: Book
 Creator(s):
Quint, Wolfgang, Editor
Vogel, Manuel, Editor
Affiliations:
-
Publ. Info: Berlin u.a. : Springer
Pages: XV, 411 S. : Ill., graph. Darst. Volume / Issue: - Sequence Number: - Start / End Page: 315 - 373 Identifier: ISBN: 978-3-642-45200-0