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  Structure-properties correlation in Si nanoparticles by total scattering and computer simulations

Petkov, V., Hessel, C. M., Ovtchinnikoff, J., Guillaussier, A., Korgel, B. A., Liu, X. F., et al. (2013). Structure-properties correlation in Si nanoparticles by total scattering and computer simulations. Chemistry of Materials, 25(11), 2365-2371. doi:10.1021/cm401099q.

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670097.pdf (Publisher version), 2MB
 
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 Creators:
Petkov, V., Author
Hessel, C. M., Author
Ovtchinnikoff, J., Author
Guillaussier, A., Author
Korgel, B. A., Author
Liu, X. F.1, Author              
Giordano, C.1, Author              
Affiliations:
1Christina Giordano, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863314              

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Free keywords: Si nanoparticles; synchrotron X-ray diffraction; atomic PDFs analysis; nanoparticle structure modeling; optical properties-nanostructure correlation
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Language(s): eng - English
 Dates: 2013
 Publication Status: Published in print
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 670097
ISI: 000320485700020
DOI: 10.1021/cm401099q
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Title: Chemistry of Materials
  Abbreviation : Chem. Mater.
Source Genre: Journal
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Publ. Info: Washington, D.C. : American Chemical Society
Pages: - Volume / Issue: 25 (11) Sequence Number: - Start / End Page: 2365 - 2371 Identifier: ISSN: 0897-4756