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  In situ three-dimensional reciprocal-space mapping during mechanical deformation

Cornelius, T. W., Davydok, A., Jacques, V. L. R., Grifone, R., Schülli, T., Richard, M. I., et al. (2012). In situ three-dimensional reciprocal-space mapping during mechanical deformation. Journal of Synchrotron Radiation, 19, 688-694. doi:10.1107/S0909049512023758.

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629244.pdf (Publisher version), 940KB
 
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 Creators:
Cornelius, T. W., Author
Davydok, A., Author
Jacques, V. L. R., Author
Grifone, R., Author
Schülli, T., Author
Richard, M. I., Author
Beutier, G., Author
Verdier, M., Author
Metzger, T. H.1, Author              
Pietsch, U., Author
Thomas, O., Author
Affiliations:
1Biomaterialien, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863285              

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Free keywords: X-ray diffraction; nanofocused XRD; energy scan; 3D reciprocal-space mapping; mechanical deformation/ properties; in situ AFM
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Language(s): eng - English
 Dates: 2012
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 629244
ISI: 000307700100004
DOI: 10.1107/S0909049512023758
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Title: Journal of Synchrotron Radiation
  Abbreviation : J. Synchrotron Radiat.
Source Genre: Journal
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Publ. Info: Copenhagen, Denmark : Published for the International Union of Crystallography by Munksgaard
Pages: Part 5 Volume / Issue: 19 Sequence Number: - Start / End Page: 688 - 694 Identifier: ISSN: 1600-5775
ISSN: 0909-0495