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  Concentration polarization effect at the deposition of charged Langmuir monolayers

Kovalchuk, V. I., Zholkovskiy, E. K., Bondarenko, M. P., Starov, V. M., & Vollhardt, D. (2011). Concentration polarization effect at the deposition of charged Langmuir monolayers. Advances in Colloid and Interface Science, 168(1-2), 114-123. doi:10.1016/j.cis.2011.05.002.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-4645-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0007-8159-3
Genre: Journal Article

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576708.pdf (Publisher version), 2MB
 
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 Creators:
Kovalchuk, V. I., Author
Zholkovskiy, E. K., Author
Bondarenko, M. P., Author
Starov, V. M., Author
Vollhardt, D.1, Author           
Affiliations:
1Reinhard Miller, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863313              

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Free keywords: Langmuir-Blodgett films; Three-phase contact; Meniscus relaxation; Charged Langmuir monolayers; Electrokinetic mechanism; Concentration polarization; Pattern formation
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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 576708
ISI: 000296687500011
DOI: 10.1016/j.cis.2011.05.002
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Title: Advances in Colloid and Interface Science
  Other : Adv. Colloid Interface Sci.
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier
Pages: - Volume / Issue: 168 (1-2) Sequence Number: - Start / End Page: 114 - 123 Identifier: ISSN: 0001-8686