English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Effects of sample polydispersity and beam profile on ellipsometric light scattering

Sigel, R., & Erbe, A. (2008). Effects of sample polydispersity and beam profile on ellipsometric light scattering. Applied Optics, 47(12), 2161-2170. doi:10.1364/AO.47.002161.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0015-53AE-6 Version Permalink: http://hdl.handle.net/21.11116/0000-0007-5106-7
Genre: Journal Article

Files

show Files
hide Files
:
361917.pdf (Publisher version), 276KB
 
File Permalink:
-
Name:
361917.pdf
Description:
-
Visibility:
Restricted (Max Planck Institute of Colloids and Interfaces, MTKG; )
MIME-Type / Checksum:
application/pdf
Technical Metadata:
Copyright Date:
-
Copyright Info:
eDoc_access: INSTITUT
License:
-

Locators

show

Creators

show
hide
 Creators:
Sigel, R.1, Author              
Erbe, A.1, Author              
Affiliations:
1Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863288              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2008
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 361917
ISI: 000255761900026
DOI: 10.1364/AO.47.002161
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Applied Optics
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Washington, DC : Optical Society of America
Pages: - Volume / Issue: 47 (12) Sequence Number: - Start / End Page: 2161 - 2170 Identifier: ISSN: 0003-6935