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  Effects of sample polydispersity and beam profile on ellipsometric light scattering

Sigel, R., & Erbe, A. (2008). Effects of sample polydispersity and beam profile on ellipsometric light scattering. Applied Optics, 47(12), 2161-2170. doi:10.1364/AO.47.002161.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-53AE-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0007-5106-7
Genre: Journal Article

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361917.pdf (Publisher version), 276KB
 
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 Creators:
Sigel, R.1, Author           
Erbe, A.1, Author           
Affiliations:
1Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863288              

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Language(s): eng - English
 Dates: 2008
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 361917
ISI: 000255761900026
DOI: 10.1364/AO.47.002161
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Title: Applied Optics
Source Genre: Journal
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Publ. Info: Washington, DC : Optical Society of America
Pages: - Volume / Issue: 47 (12) Sequence Number: - Start / End Page: 2161 - 2170 Identifier: ISSN: 0003-6935