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  Measuring mechanical properties of polyelectrolyte multilayer thin films : novel methods based on AFM and optical techniques

Picart, C., Senger, B., Sengupta, K., Dubreuil, F., & Fery, A. (2007). Measuring mechanical properties of polyelectrolyte multilayer thin films: novel methods based on AFM and optical techniques. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 303(1-2), 30-36. doi:10.1016/j.colsurfa.2007.02.015.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-56B9-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-F9FD-5
Genre: Journal Article

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Article.pdf (Publisher version), 667KB
 
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 Creators:
Picart, C., Author
Senger, B., Author
Sengupta, K., Author
Dubreuil, F.1, Author           
Fery, A.1, Author           
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              

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 Dates: 2007
 Publication Status: Published in print
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 Rev. Type: -
 Identifiers: eDoc: 329310
ISI: 000247771200004
DOI: 10.1016/j.colsurfa.2007.02.015
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Title: Colloids and Surfaces A: Physicochemical and Engineering Aspects
Source Genre: Journal
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Publ. Info: Amsterdam : Elsevier
Pages: - Volume / Issue: 303 (1-2) Sequence Number: - Start / End Page: 30 - 36 Identifier: ISSN: 0927-7757