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  Soft X-ray microscopy to characterize polyelectrolyte assemblies

Köhler, K., Dejugnat, C., Dubois, M., Zemb, T., Sukhorukov, G. B., Guttmann, P., et al. (2007). Soft X-ray microscopy to characterize polyelectrolyte assemblies. The Journal of Physical Chemistry B, 111(29), 8388-8393. doi:10.1021/jp070360+.

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 Creators:
Köhler, K.1, Author              
Dejugnat, C., Author
Dubois, M.1, Author
Zemb, T., Author
Sukhorukov, G. B.1, Author              
Guttmann, P., Author
Möhwald, H.2, Author              
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              
2Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863312              

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 Dates: 2007
 Publication Status: Published in print
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 Rev. Type: -
 Identifiers: eDoc: 329324
ISI: 000248121500009
DOI: 10.1021/jp070360+
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Title: The Journal of Physical Chemistry B
  Other : J. Phys. Chem. B
Source Genre: Journal
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Publ. Info: Washington, D.C. : American Chemical Society
Pages: - Volume / Issue: 111 (29) Sequence Number: - Start / End Page: 8388 - 8393 Identifier: ISSN: 1520-6106