Soft X-ray microscopy to characterize polyelectrolyte assemblies

Köhler, K.; Dejugnat, C.; Dubois, M.; Zemb, T.; Sukhorukov, G. B.; Guttmann, P.; Möhwald, H.

doi:10.1021/jp070360+

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Soft X-ray microscopy to characterize polyelectrolyte assemblies

Köhler, K., Dejugnat, C., Dubois, M., Zemb, T., Sukhorukov, G. B., Guttmann, P., et al. (2007). Soft X-ray microscopy to characterize polyelectrolyte assemblies. The Journal of Physical Chemistry B, 111(29), 8388-8393. doi:10.1021/jp070360+.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-56DC-C Version Permalink: https://hdl.handle.net/21.11116/0000-0006-CBC3-9

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Köhler, K.¹, Author
Dejugnat, C., Author
Dubois, M.¹, Author
Zemb, T., Author
Sukhorukov, G. B.¹, Author
Guttmann, P., Author
Möhwald, H.², Author

Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287
2Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863312

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Dates: Date issued: 2007

Publication Status: Issued

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Identifiers: eDoc: 329324
ISI: 000248121500009
DOI: 10.1021/jp070360+

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Title: The Journal of Physical Chemistry B

Other : J. Phys. Chem. B

Source Genre: Journal

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Publ. Info: Washington, D.C. : American Chemical Society

Pages: - Volume / Issue: 111 (29) Sequence Number: - Start / End Page: 8388 - 8393 Identifier: ISSN: 1520-6106