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  Soft X-ray microscopy to characterize polyelectrolyte assemblies

Köhler, K., Dejugnat, C., Dubois, M., Zemb, T., Sukhorukov, G. B., Guttmann, P., et al. (2007). Soft X-ray microscopy to characterize polyelectrolyte assemblies. Journal of Physical Chemistry B, 111(29), 8388-8393.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-56DC-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-56DD-A
Genre: Journal Article

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 Creators:
Köhler, K.1, Author           
Dejugnat, C., Author
Dubois, M., Author
Zemb, T., Author
Sukhorukov, G. B.1, Author           
Guttmann, P., Author
Möhwald, H.2, Author           
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              
2Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863312              

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 Dates: 2007-07-26
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 329324
ISI: 000248121500009
ISI: 000248121500009
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Title: Journal of Physical Chemistry B
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 111 (29) Sequence Number: - Start / End Page: 8388 - 8393 Identifier: -