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  X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface

Kubowicz, S., Thünemann, A. F., Geue, T. M., Pietsch, U., Watson, M. D., Tchebotareva, N., et al. (2003). X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface. Langmuir, 19(26), 10997-10999. doi:10.1021/la035210e.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-6204-B Version Permalink: https://hdl.handle.net/21.11116/0000-0008-04F7-D
Genre: Journal Article

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112636.pdf (Publisher version), 92KB
 
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 Creators:
Kubowicz, S.1, Author           
Thünemann, A. F., Author
Geue, T. M., Author
Pietsch, U., Author
Watson, M. D., Author
Tchebotareva, N., Author
Müllen, K., Author
Affiliations:
1Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863287              

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 Dates: 2003
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 112636
ISI: 000187507500052
DOI: 10.1021/la035210e
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Title: Langmuir
Source Genre: Journal
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Publ. Info: Columbus, OH : American Chemical Society
Pages: - Volume / Issue: 19 (26) Sequence Number: - Start / End Page: 10997 - 10999 Identifier: ISSN: 0743-7463